Ningbo Ruike Weiye Instrument Co., Ltd
Home>Products>FT-341 dual electric four probe resistivity/square resistance tester
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FT-341 dual electric four probe resistivity/square resistance tester
FT-341 dual electric four probe resistivity/square resistance tester
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FT-341Dual electric measurement four proberesistivity/Square resistance tester

Widely used for: covering film;Conductive polymer film, high and low temperature electric heating film;Thermal insulation, radiation protection, conductive window film, conductive(shield)Cloth, decorative film, decorative paper;Metallized labels, alloy foil films;Melting, sintering, sputtering, coating, coating layer, resistive and capacitive touch screen film;Resistance testing of electrode coatings, other semiconductor materials, and thin film materials

Detailed information

FT-341Dual electric measurement four proberesistivity/Square resistance tester

Widely used for: covering film;Conductive polymer film, high and low temperature electric heating film;Thermal insulation, radiation protection, conductive window film, conductive(shield)Cloth, decorative film, decorative paper;Metallized labels, alloy foil films;Melting, sintering, sputtering, coating, coating layer, resistive and capacitive touch screen film;Resistance testing of electrode coatings, other semiconductor materials, and thin film materials

Silicon block, chip resistivity and diffusion layer, epitaxial layerITOConductive foil film, conductive rubber and other materials block resistance Thin layer resistance and resistivity of semiconductor materials/wafers, solar cells, electronic components, conductive thin films (ITO conductive film glass, etc.), metal films, conductive paint films, evaporated aluminum films, PCB copper foil films, EMI coatings, and other substances Conductive paint, conductive paste, conductive plastic, conductive rubber, conductive film, metal film, anti-static material,EMIProtective materials, conductive fibers, conductive ceramics, etc

This instrument adopts the four probe dual electric measurement method and is suitable for production enterprises, universities, and research departments. It is an important tool for inspecting and analyzing the quality of conductor and semiconductor materials. This instrument is equipped with various measuring devices to test different materials. LCD display, no need for manual calculation, with temperature compensation function, automatic selection of resistivity unit, instrument automatic measurement and automatic range conversion based on test results, no need for manual multiple and repeated settings. Adopting high precisionADChip control, constant current output, reasonable structure, lightweight quality, safe transportation, and convenient use; Optional: Equipped with software that can be controlled by a computer, saving and printing data, and automatically generating reports; This instrument adopts4.3Large LCD screen display, simultaneously displaying LCD display: resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness.

Conductivity, different testing fixtures can meet the testing requirements of different materials. Testing fixtures can be selected according to product and testing project requirementsThe dual electric measurement digital four probe tester uses linear or square four probe dual position measurement. The instrument design complies with the physical testing method standards for single crystal silicon and references the United StatesA.S.T.M

Standard. By using the transformation of current probes and voltage probes, two electrical measurements are taken, and the data is analyzed using dual electrical measurements. This automatically eliminates the influence of sample geometry, boundary effects, probe misalignment, and mechanical drift on the measurement results. Compared with single electrical measurement linear or square four probe probes, it greatly improves the accuracy, especially suitable for testing micro areas with oblique four probe probes.

Parameter data-51. Block resistance range: 1025×10

Ω/□-52. Range of resistivity: 1026×10

Ω-cm3. Test current range: 0.1 μ A,1μA10μA100µA1mA10mA

100 mA

4. Current accuracy: ± 0.1% reading

5. Resistance accuracy: ≤ 0.3%

6. Display reading: LCD display: resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thicknessConductivity7. Testing method

:Dual electric measurement8. Working power supply

:Input: AC 220V ± 10%, 50Hz power consumption:< 30W9. Uncertainty error of the whole machine

:≤ 4% (standard sample result)10. Selection function:choose2.1.pc3.Software;4.choose

Square probe; choose Linear probe; chooseTesting Platform11. Test probe:Probe spacing selection:1mm2mm3mmThree specifications;

Probe material selection: tungsten carbide needle;.

White steel needle; Gold plated phosphor copper hemispherical needle

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